Login

 

Agilent N2X

-
Multi-services test solution

Product Configuration

The Agilent N2X system consists of a system controller and multiple chassis containing purpose-built Test Cards for specific test requirements. The system controller provides a graphical interface to drive applications running on the Test Cards.

 

System Controller Top

A number of system controllers are available depending on your performance requirements. The controller provides an easy-to use Windows® environment.
» Find out More

N2X Chassis Top

Easily daisy chain up to 60 N2X chassis to create the industry's highest density of test ports. The highly compact 4-slot chassis and 2-slot portable chassis are available for both development environment and in-field use. Hot-swappable Test Cards can be moved between chassis without affecting other test sessions.
» Find out More

N2X Test Cards Top

High-density, scalable and flexible N2X Test Cards are optimized for specific test needs of Next Generation Transport, Carrier Routing, Broadband Access and Enterprise networks and devices.

  • N2X XM Test Cards - SONET/SDH Test Cards for simulation and analysis of multi-channel loading, errors, alarms and switching performance.
  • N2X XP Test Cards - Packet Test Cards for comprehensive traffic generation and analysis testing.
  • N2X XR Test Cards - Packets and Protocols Test Cards for integrated traffic generation and realistic protocol emulation for dynamic network testing.
  • N2X XS Test Cards - High-performance Packets and Protocols Test Cards optimized deliver industry's highest protocol emulation scalability for network stress testing.

» Find out More

N2X ApplicationsTop

  • The N2X Multi-services Transport application
  • The N2X Packets and Protocols application enables N2X to verify the traffic forwarding performance, protocol scalability and services delivering capabilities of switching and routing devices across the enterprise, metro/edge and core.

» Find out More


Related Information Top

 


Network Services Infrastructure Devices Under Test Technology Industry Solutions